Rupich M.W., Thieme C.L., Li X., Fleshler S., Sathyamurthy S., DeMoranville K., Tucker D., Podtburg E., Jr J.G., Whitman L.
Ключевые слова: HTS, YBCO, coated conductors, critical caracteristics, status, critical current, uniformity, ac losses, Jc/B curves, coils, mechanical properties, winding tension
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, doping effect, YBCO, substrate Ni-W, MOD process
Ключевые слова: patents, HTS, coated conductors, stabilizing layers, HTS, YBCO, fabrication
Ключевые слова: patents, HTS, coated conductors, fabrication, reel-to-reel process, buffer layers, long conductors, multilayered structures
Rupich M.W., Thieme C.L., Li X., Siegal E., Buczek D., Lynch J., Fleshler S., Sathyamurthy S., Thompson E., Teplitsky M., DeMoranville K., Schreiber J., Tucker D., Hannus D., Inch J., Savoy R.
Ключевые слова: patents, HTS, coated conductors multifilamentary, ac losses, YBCO, fabrication
Ключевые слова: HTS, YBCO, coated conductors transposed, ac losses, patterning, experimental results
Ключевые слова: patents, HTS, coated conductors multifilamentary, YBCO, fabrication
Ключевые слова: presentation, HTS, YBCO, coated conductors, RABITS process, MOD process, long conductors, fabrication, critical current, homogeneity, angular dependence, thickness dependence, length
Ключевые слова: HTS, coated conductors, substrate Ni-W, RABITS process, magnetization curves, ac losses, magnetic properties, fabrication
Ключевые слова: HTS, YBCO, coated conductors, long conductors, critical current, homogeneity, critical caracteristics, experimental results, RABITS process, MOD process, fabrication, length
Thieme C.L., Ekin J.W., Xie Y., Cheggour N.(cheggour@ boulder.nist.gov)
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Buczek D., Lynch J., Verebelyi D.T., Aized D., Huang Y., King C., Carter W., Schreiber J., Prasova M., Tucker D., Harnois R.
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Ключевые слова: HTS, YBCO, coated conductors, stress effects, fatigue behavior, mechanical properties, IBAD process, RABITS process, coated conductors multifilamentary, crack formation, MOD process, MOCVD process, comparison, critical current density, degradation studies, experimental results, critical caracteristics, fabrication
Li X., Kodenkandath T., Huang Y., Siegal E., Buczek D., Carter W., Nguyen N., Schreiber J., Prasova M., Lynch J., Tucker D., Fleshler S., Zhang W., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L.
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